TY  - RPRT
TI  - Acceptor-Induced Bulk Dielectric Loss in Superconducting Circuits on Silicon
AU  - Zhang, Zi-Huai
AU  - Godeneli, Kadircan
AU  - He, Justin
AU  - Odeh, Mutasem
AU  - Zhou, Haoxin
AU  - Meesala, Srujan
AU  - Sipahigil, Alp
PY  - 2024
DO  - 10.1103/physrevx.14.041022
UR  - https://www.osti.gov/biblio/2473339
ID  - 2473339
ER  -