@misc{indiciae5f1a59982938,
  title = {Characterizing Defects Inside Hexagonal Boron Nitride Using Random Telegraph Signals in van der Waals 2D Transistors},
  author = {Huang, Zhujun and Lee, Ryong-Gyu and Cuniberto, Edoardo and Song, Jiyoon and Lee, Jeongwon and Alharbi, Abdullah and Kisslinger, Kim and Taniguchi, Takashi and Watanabe, Kenji and Kim, Yong-Hoon and Shahrjerdi, Davood},
  year = {2024},
  doi = {10.1021/acsnano.4c06929},
  url = {https://www.osti.gov/biblio/2474822},
  note = {Source identifier: 2474822}
}