@misc{indiciae001751f26b52,
  title = {Sub-micron Glue Thickness Measurement and Uncertainty Determination for Dynamic Material Experiments on NIF},
  author = {Hackbarth, J and Mcnaney, J and Eggert, J and Kumar, C and Schiaffino, S and Riddles, J and Wilson, M},
  year = {2024},
  url = {https://www.osti.gov/biblio/2479016},
  note = {Source identifier: 2479016}
}