TY  - RPRT
TI  - Sub-micron Glue Thickness Measurement and Uncertainty Determination for Dynamic Material Experiments on NIF
AU  - Hackbarth, J
AU  - Mcnaney, J
AU  - Eggert, J
AU  - Kumar, C
AU  - Schiaffino, S
AU  - Riddles, J
AU  - Wilson, M
PY  - 2024
UR  - https://www.osti.gov/biblio/2479016
ID  - 2479016
ER  -