TY  - RPRT
TI  - Reduction of vanadium diffusivity within copper grain boundaries due to enhanced binding
AU  - Liu, T. Y. [Texas A&M University, College Station, TX (United States); Texas A&M University] (ORCID:0000000171886986)
AU  - Sheu, E. [Texas A&M University, College Station, TX (United States)] (ORCID:0000000162436684)
AU  - Tavakolzadeh, M. [Texas A&M University, College Station, TX (United States)]
AU  - Williams, D. J. [Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)]
AU  - Baldwin, J. K. [Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)]
AU  - Demkowicz, M. J. [Texas A&M University, College Station, TX (United States)] (ORCID:0000000273053045)
PY  - 2024
DO  - 10.1016/j.scriptamat.2024.116515
UR  - https://www.osti.gov/biblio/2481681
ID  - 2481681
ER  -