TY  - RPRT
TI  - Resolving electrochemically triggered topological defect dynamics and structural degradation in layered oxides
AU  - Wang, Chunyang (ORCID:0000000184613952)
AU  - Zhang, Rui
AU  - Li, Ju (ORCID:0000000278418058)
AU  - Xin, Huolin L. (ORCID:000000026521868X)
PY  - 2025
DO  - 10.1073/pnas.2409494122
UR  - https://www.osti.gov/biblio/2499814
ID  - 2499814
ER  -