@misc{indiciaefeb57dd8b9d9,
  title = {Structural properties and recrystallization effects in ion beam modified B20-type FeGe films},
  author = {Liu, Jiangteng [Univ. of Washington, Seattle, WA (United States)] (ORCID:0009000392868252) and Schoell, Ryan [Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000209186038) and Zhang, Xiyue S. [Cornell Univ., Ithaca, NY (United States)] (ORCID:0000000311036415) and Yang, Hongbin [Cornell Univ., Ithaca, NY (United States)] (ORCID:0000000200986944) and Venuti, M. B. [Colorado School of Mines, Golden, CO (United States)] (ORCID:0000000163776744) and Paik, Hanjong [Cornell Univ., Ithaca, NY (United States); Univ. of Oklahoma, Norman, OK (United States)] (ORCID:0000000283634679) and Muller, David A. [Cornell Univ., Ithaca, NY (United States)] (ORCID:0000000341290473) and Lu, Tzu-Ming [Sandia National Lab. (SNL-NM), Albuquerque, NM (United States). Center for Integrated Nanotechnologies (CINT)] (ORCID:0000000233631226) and Hattar, Khalid [Univ. of Tennessee, Knoxville, TN (United States)] (ORCID:0000000206092802) and Eley, Serena [Univ. of Washington, Seattle, WA (United States); Colorado School of Mines, Golden, CO (United States)] (ORCID:0000000229285316)},
  year = {2025},
  doi = {10.1063/5.0237131},
  url = {https://www.osti.gov/biblio/2502153},
  note = {Source identifier: 2502153}
}