TY  - RPRT
TI  - Parallel tempered Bayesian inference for characterizing non-ideal semiconductors: Carrier trapping in cadmium telluride thin films
AU  - Fai, Calvin
AU  - Ladd, Anthony J. C. (ORCID:0000000202710650)
AU  - Hages, Charles J.
AU  - Manoukian, Gregory A.
AU  - Baxter, Jason B.
PY  - 2025
DO  - 10.1016/j.isci.2025.111850
UR  - https://www.osti.gov/biblio/2504256
ID  - 2504256
ER  -