TY  - RPRT
TI  - AdaptiveDet: Defect Detection for Digital Printing Fabric with Complex Background
AU  - Su, Zebin [School of Electronics and Information, Xi’an Polytechnic University, Xi’an, China, Shaanxi Artificial Intelligence Joint Laboratory, Xi’an Polytechnic University, Xi’an, China]
AU  - Zhang, Xingyi [School of Electronics and Information, Xi’an Polytechnic University, Xi’an, China, Shaanxi Artificial Intelligence Joint Laboratory, Xi’an Polytechnic University, Xi’an, China]
AU  - Li, Jiamin [School of Electronics and Information, Xi’an Polytechnic University, Xi’an, China, Shaanxi Artificial Intelligence Joint Laboratory, Xi’an Polytechnic University, Xi’an, China]
AU  - Shao, Yunlong [School of Electronics and Information, Xi’an Polytechnic University, Xi’an, China, Shaanxi Artificial Intelligence Joint Laboratory, Xi’an Polytechnic University, Xi’an, China]
AU  - Li, Pengfei [School of Electronics and Information, Xi’an Polytechnic University, Xi’an, China, Shaanxi Artificial Intelligence Joint Laboratory, Xi’an Polytechnic University, Xi’an, China]
AU  - Zhang, Huanhuan [School of Electronics and Information, Xi’an Polytechnic University, Xi’an, China, Shaanxi Artificial Intelligence Joint Laboratory, Xi’an Polytechnic University, Xi’an, China]
PY  - 2025
DO  - 10.1080/15440478.2025.2454268
UR  - https://www.osti.gov/biblio/2505088
ID  - 2505088
ER  -