@misc{indiciaec5029da46937,
  title = {Understanding and removing FIB artifacts in metallic TEM samples using flash electropolishing},
  author = {Edwards, Danny J. (ORCID:000000027676490X) and Schemer-Kohrn, Alan and Olszta, Matt and Prabhakaran, Ramprashad and Zhu, Yuanyuan (ORCID:0000000252575645) and Wang, Jing (ORCID:0000000184026862) and Haag, Jacob and Atwani, Osman El (ORCID:0000000218627018) and Lach, Timothy G. (ORCID:0000000247454179) and Toloczko, Mychailo (ORCID:0000000338786101)},
  year = {2025},
  doi = {10.1016/j.jnucmat.2025.155618},
  url = {https://www.osti.gov/biblio/2513590},
  note = {Source identifier: 2513590}
}