TY  - RPRT
TI  - Understanding and removing FIB artifacts in metallic TEM samples using flash electropolishing
AU  - Edwards, Danny J. (ORCID:000000027676490X)
AU  - Schemer-Kohrn, Alan
AU  - Olszta, Matt
AU  - Prabhakaran, Ramprashad
AU  - Zhu, Yuanyuan (ORCID:0000000252575645)
AU  - Wang, Jing (ORCID:0000000184026862)
AU  - Haag, Jacob
AU  - Atwani, Osman El (ORCID:0000000218627018)
AU  - Lach, Timothy G. (ORCID:0000000247454179)
AU  - Toloczko, Mychailo (ORCID:0000000338786101)
PY  - 2025
DO  - 10.1016/j.jnucmat.2025.155618
UR  - https://www.osti.gov/biblio/2513590
ID  - 2513590
ER  -