TY  - RPRT
TI  - Non-perturbative cathodoluminescence microscopy of beam-sensitive materials
AU  - Bogroff, Malcolm [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:000900098688396X)
AU  - Cowley, Gabriel [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)]
AU  - Nicastro, Ariel [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0009000424596539)
AU  - Levy, David [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0009000632492849)
AU  - Wu, Yueh-Chun [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)]
AU  - Mao, Nannan [Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States)] (ORCID:0000000335225341)
AU  - Yang, Tilo H. [Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States)]
AU  - Zhang, Tianyi [Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States)]
AU  - Kong, Jing [Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States)]
AU  - Vasudevan, Rama [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)] (ORCID:0000000346928579)
AU  - Kelley, Kyle P. [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)] (ORCID:0000000276880484)
AU  - Lawrie, Benjamin J. [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:000000031431066X)
PY  - 2025
DO  - 10.1515/nanoph-2024-0724
UR  - https://www.osti.gov/biblio/2526666
ID  - 2526666
ER  -