@misc{indiciae030700dba64e,
  title = {Electron density profile and associated fluctuation measurements using a microwave reflectometry diagnostic on Helically Symmetric eXperiment (HSX)},
  author = {Han, X. (ORCID:0000000184986433) and Richardson, M. and Likin, K. M. and Hillebrecht, H. O. M. (ORCID:000000028682235X) and Geiger, B. (ORCID:0000000187061874) and Goodman, W. (ORCID:0000000199872690) and Wolfmeister, A. and Knowles, B. (ORCID:0009000581895073) and Wagner, R.},
  year = {2025},
  doi = {10.1088/1361-6587/adbc1f},
  url = {https://www.osti.gov/biblio/2530457},
  note = {Source identifier: 2530457}
}