@misc{indiciaed2140a229900,
  title = {Machine-learning-enabled on-the-fly analysis of RHEED patterns during thin film deposition by molecular beam epitaxy},
  author = {Kaspar, Tiffany C. (ORCID:0000000328167569) and Akers, Sarah (ORCID:0000000337275801) and Sprueill, Henry W. (ORCID:0000000279814175) and Ter-Petrosyan, Arman H. (ORCID:0000000309238253) and Bilbrey, Jenna A. (ORCID:0000000241997244) and Hopkins, Derek and Harilal, Ajay and Christudasjustus, Jijo (ORCID:0000000260244467) and Gemperline, Patrick (ORCID:0000000153019133) and Comes, Ryan B. (ORCID:0000000253046921)},
  year = {2025},
  doi = {10.1116/6.0004493},
  url = {https://www.osti.gov/biblio/2540152},
  note = {Source identifier: 2540152}
}