@misc{indiciaef1dc3c58b5ba,
  title = {Surface Charge Migration in SiC Power MOSFETs Induced by HVDC-H3TRB Testing},
  author = {Rummel, Brian Douglas},
  year = {2024},
  doi = {10.2172/2540302},
  url = {https://www.osti.gov/biblio/2540302},
  note = {Source identifier: 2540302}
}