TY  - RPRT
TI  - Surface Charge Migration in SiC Power MOSFETs Induced by HVDC-H3TRB Testing
AU  - Rummel, Brian Douglas
PY  - 2024
DO  - 10.2172/2540302
UR  - https://www.osti.gov/biblio/2540302
ID  - 2540302
ER  -