TY  - RPRT
TI  - Machine learning-aided automatic recognition and precise localization of marker layers within multilayer Laue lenses (MLLs) for high-resolution X-ray nanofocusing
AU  - Xu, Wei
AU  - Xu, Weihe
AU  - Bouet, Nathalie
AU  - Zhou, Juan
AU  - Yan, Hanfei
AU  - Huang, Xiaojing
AU  - Gao, Zirui
AU  - Lu, Ming
AU  - Chu, Yong S.
AU  - Nazaretski, Evgeny
PY  - 2025
DO  - 10.1016/j.optlastec.2025.112847
UR  - https://www.osti.gov/biblio/2543132
ID  - 2543132
ER  -