@misc{indiciae8bfec748c371,
  title = {Polarization-type potential-induced degradation in bifacial PERC modules in the field},
  author = {Hacke, Peter [National Renewable Energy Laboratory (NREL), Golden, CO (United States)] (ORCID:0000000348500947) and Molto, Cecile [University of Central Florida, Cocoa, FL (United States). Florida Solar Energy Center (FSEC)] and Colvin, Dylan [University of Central Florida, Cocoa, FL (United States). Florida Solar Energy Center (FSEC)] and Smith, Ryan [Pordis LLC, Austin, TX (United States)] (ORCID:0000000308978567) and Mahmood, Farrukh Ibne [Arizona State University, Mesa, AZ (United States). Photovoltaic Reliability Laboratory] and Li, Fang [Arizona State University, Mesa, AZ (United States). Photovoltaic Reliability Laboratory] and Oh, Jaewon [University of North Carolina, Charlotte, NC (United States)] and Tamizhmani, Govindasamy [Arizona State University, Mesa, AZ (United States). Photovoltaic Reliability Laboratory] and Seigneur, Hubert [University of Central Florida, Cocoa, FL (United States). Florida Solar Energy Center (FSEC)] (ORCID:0000000250474541)},
  year = {2025},
  doi = {10.1051/epjpv/2025004},
  url = {https://www.osti.gov/biblio/2545692},
  note = {Source identifier: 2545692}
}