TY  - RPRT
TI  - Polarization-type potential-induced degradation in bifacial PERC modules in the field
AU  - Hacke, Peter [National Renewable Energy Laboratory (NREL), Golden, CO (United States)] (ORCID:0000000348500947)
AU  - Molto, Cecile [University of Central Florida, Cocoa, FL (United States). Florida Solar Energy Center (FSEC)]
AU  - Colvin, Dylan [University of Central Florida, Cocoa, FL (United States). Florida Solar Energy Center (FSEC)]
AU  - Smith, Ryan [Pordis LLC, Austin, TX (United States)] (ORCID:0000000308978567)
AU  - Mahmood, Farrukh Ibne [Arizona State University, Mesa, AZ (United States). Photovoltaic Reliability Laboratory]
AU  - Li, Fang [Arizona State University, Mesa, AZ (United States). Photovoltaic Reliability Laboratory]
AU  - Oh, Jaewon [University of North Carolina, Charlotte, NC (United States)]
AU  - Tamizhmani, Govindasamy [Arizona State University, Mesa, AZ (United States). Photovoltaic Reliability Laboratory]
AU  - Seigneur, Hubert [University of Central Florida, Cocoa, FL (United States). Florida Solar Energy Center (FSEC)] (ORCID:0000000250474541)
PY  - 2025
DO  - 10.1051/epjpv/2025004
UR  - https://www.osti.gov/biblio/2545692
ID  - 2545692
ER  -