@misc{indiciaed48c509a528e,
  title = {Ionization effects in single-shot carrier-envelope phase detection with gas-gap devices},
  author = {Blöchl, Johannes [Ludwig Maximilian Univ. of Munich, Munich (Germany); Max Planck Institute of Quantum Optics, Garching (Germany); UltraFast Innovations GmbH, Garching (Germany)] (ORCID:0000000336672872) and Seeger, Maximilian F. [Ludwig Maximilian Univ. of Munich, Munich (Germany); Max Planck Institute of Quantum Optics, Garching (Germany)] and Schröder, Hartmut [Max Planck Institute of Quantum Optics, Garching (Germany)] (ORCID:0009000744162449) and Zhan, Minjie [UltraFast Innovations GmbH, Garching (Germany)] (ORCID:0009000229716451) and Guggenmos, Alexander [UltraFast Innovations GmbH, Garching (Germany)] (ORCID:0000000329759136) and Nubbemeyer, Thomas [Ludwig Maximilian Univ. of Munich, Munich (Germany); Max Planck Institute of Quantum Optics, Garching (Germany)] (ORCID:0009000513404746) and Kling, Matthias F. [Ludwig Maximilian Univ. of Munich, Munich (Germany); Max Planck Institute of Quantum Optics, Garching (Germany); SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States); Stanford Univ., CA (United States)] (ORCID:0000000217100775) and Bergues, Boris [Ludwig Maximilian Univ. of Munich, Munich (Germany); Max Planck Institute of Quantum Optics, Garching (Germany); UltraFast Innovations GmbH, Garching (Germany)] (ORCID:0000000331900020)},
  year = {2025},
  doi = {10.1063/5.0246794},
  url = {https://www.osti.gov/biblio/2549426},
  note = {Source identifier: 2549426}
}