@misc{indiciaee9cd8d5211b3,
  title = {High-count rate effects in event processing for XRISM/ Resolve X-ray microcalorimeter: I. Ground test},
  author = {Mizumoto, Misaki [University of Teacher Education Fukuoka, Fukuoka (Japan)] and Tamba, Tsubasa [Japan Aerospace Exploration Agency (ISAS/JAXA), Sagamihara, Kanagawa (Japan). Institute of Space and Astronautical Science] and Tsujimoto, Masahiro [Japan Aerospace Exploration Agency (ISAS/JAXA), Sagamihara, Kanagawa (Japan). Institute of Space and Astronautical Science] and Cumbee, Renata S. [NASA Goddard Space Flight Center (GSFC), Greenbelt, MD (United States)] and Eckart, Megan E. [Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)] and Hodges-Kluck, Edmund [NASA Goddard Space Flight Center (GSFC), Greenbelt, MD (United States)] and Ishisaki, Yoshitaka [Japan Aerospace Exploration Agency (ISAS/JAXA), Sagamihara, Kanagawa (Japan). Institute of Space and Astronautical Science] and Kilbourne, Caroline A. [NASA Goddard Space Flight Center (GSFC), Greenbelt, MD (United States)] and Leutenegger, Maurice A. [NASA Goddard Space Flight Center (GSFC), Greenbelt, MD (United States)] and Porter, Frederick S. [NASA Goddard Space Flight Center (GSFC), Greenbelt, MD (United States)] and Sawada, Makoto [Rikkyo University, Tokyo (Japan)] and Takei, Yoh [Japan Aerospace Exploration Agency (ISAS/JAXA), Ibaraki, Kanagawa (Japan)] and Uchida, Yuusuke [Tokyo Univ. of Science, Chiba (Japan)] and Yamada, Shin’ya [Rikkyo University, Tokyo (Japan)]},
  year = {2025},
  doi = {10.1117/1.jatis.11.4.042005},
  url = {https://www.osti.gov/biblio/2556952},
  note = {Source identifier: 2556952}
}