@misc{indiciaee97428d6cebc,
  title = {Scientific exploration with expert knowledge (SEEK) in autonomous scanning probe microscopy with active learning},
  author = {Pratiush, Utkarsh [Department of Materials Science and Engineering, The University of Tennessee Knoxville, Knoxville, Tennessee 37996, USA] (ORCID:000900037249103X) and Funakubo, Hiroshi [Department of Materials Science and Engineering, Tokyo Institute of Technology, Yokohama, 226-8502, Japan] and Vasudevan, Rama [Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37830, USA] (ORCID:0000000346928579) and Kalinin, Sergei V. [Department of Materials Science and Engineering, The University of Tennessee Knoxville, Knoxville, Tennessee 37996, USA, Physical Sciences Division, Pacific Northwest National Laboratory, Richland, Washington 99354, USA] and Liu, Yongtao [Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37830, USA]},
  year = {2025},
  doi = {10.1039/d4dd00277f},
  url = {https://www.osti.gov/biblio/2561455},
  note = {Source identifier: 2561455}
}