TY  - RPRT
TI  - Computationally guided experimental validation of divacancy defect formation in 4H-SiC
AU  - Kimura, Taishi [Univ. of Michigan, Ann Arbor, MI (United States); Argonne National Laboratory (ANL), Argonne, IL (United States)] (ORCID:0000000212841814)
AU  - Ahn, Jonghoon [Argonne National Laboratory (ANL), Argonne, IL (United States)] (ORCID:000000023246143X)
AU  - Delegan, Nazar [Argonne National Laboratory (ANL), Argonne, IL (United States)] (ORCID:0000000212406409)
AU  - Dibos, Alan [Argonne National Laboratory (ANL), Argonne, IL (United States)] (ORCID:0000000159351364)
AU  - Zhang, Jiefei [Argonne National Laboratory (ANL), Argonne, IL (United States)] (ORCID:0000000273293110)
AU  - Pingault, Benjamin [Argonne National Laboratory (ANL), Argonne, IL (United States); Univ. of Chicago, IL (United States)] (ORCID:0000000312592747)
AU  - Zhang, Cunzhi [Univ. of Chicago, IL (United States)] (ORCID:000000024562535X)
AU  - Galli, Giulia [Argonne National Laboratory (ANL), Argonne, IL (United States); Univ. of Chicago, IL (United States)] (ORCID:0000000280015290)
AU  - Awschalom, David [Argonne National Laboratory (ANL), Argonne, IL (United States); Univ. of Chicago, IL (United States)] (ORCID:0000000285912687)
AU  - Heremans, F. Joseph [Argonne National Laboratory (ANL), Argonne, IL (United States); Univ. of Chicago, IL (United States)] (ORCID:0000000333377958)
PY  - 2025
DO  - 10.1063/5.0255575
UR  - https://www.osti.gov/biblio/2562222
ID  - 2562222
ER  -