TY  - RPRT
TI  - Defect Stability in CdTe Based on Formation Energies and Migration Barriers
AU  - Chatratin, Intuon [University of Delaware, Newark, DE (United States); University of Delaware] (ORCID:0009000818402549)
AU  - Evangelista, Igor [University of Delaware, Newark, DE (United States)] (ORCID:0000000324029484)
AU  - McCandless, Brian [University of Delaware, Newark, DE (United States)]
AU  - Shafarman, William [University of Delaware, Newark, DE (United States)] (ORCID:0000000289374775)
AU  - Janotti, Anderson [University of Delaware, Newark, DE (United States)] (ORCID:0000000203582101)
PY  - 2025
DO  - 10.1021/acs.jpcc.4c05606
UR  - https://www.osti.gov/biblio/2562925
ID  - 2562925
ER  -