@misc{indiciaec4f22104bbd0,
  title = {Taking three-dimensional x-ray diffraction (3DXRD) from the synchrotron to the laboratory scale},
  author = {Oh, Seunghee [Univ. of Michigan, Ann Arbor, MI (United States); Argonne National Laboratory (ANL), Argonne, IL (United States)] (ORCID:0000000269793235) and Jin, Yuefeng [Univ. of Michigan, Ann Arbor, MI (United States)] (ORCID:0000000243759100) and Lee, Sangwon [Univ. of Michigan, Ann Arbor, MI (United States)] and Li, Wenxi [Univ. of Michigan, Ann Arbor, MI (United States)] and Geauvreau, Ken [PROTO Manufacturing Ltd., Windsor, ON (Canada)] and Williams, Matthew [PROTO Manufacturing Ltd., Windsor, ON (Canada)] (ORCID:0000000262232849) and Drake, Robert [PROTO Manufacturing Ltd., Windsor, ON (Canada)] and Bucsek, Ashley [Univ. of Michigan, Ann Arbor, MI (United States)] (ORCID:0000000325607135)},
  year = {2025},
  doi = {10.1038/s41467-025-58255-x},
  url = {https://www.osti.gov/biblio/2563504},
  note = {Source identifier: 2563504}
}