TY  - RPRT
TI  - Taking three-dimensional x-ray diffraction (3DXRD) from the synchrotron to the laboratory scale
AU  - Oh, Seunghee [Univ. of Michigan, Ann Arbor, MI (United States); Argonne National Laboratory (ANL), Argonne, IL (United States)] (ORCID:0000000269793235)
AU  - Jin, Yuefeng [Univ. of Michigan, Ann Arbor, MI (United States)] (ORCID:0000000243759100)
AU  - Lee, Sangwon [Univ. of Michigan, Ann Arbor, MI (United States)]
AU  - Li, Wenxi [Univ. of Michigan, Ann Arbor, MI (United States)]
AU  - Geauvreau, Ken [PROTO Manufacturing Ltd., Windsor, ON (Canada)]
AU  - Williams, Matthew [PROTO Manufacturing Ltd., Windsor, ON (Canada)] (ORCID:0000000262232849)
AU  - Drake, Robert [PROTO Manufacturing Ltd., Windsor, ON (Canada)]
AU  - Bucsek, Ashley [Univ. of Michigan, Ann Arbor, MI (United States)] (ORCID:0000000325607135)
PY  - 2025
DO  - 10.1038/s41467-025-58255-x
UR  - https://www.osti.gov/biblio/2563504
ID  - 2563504
ER  -