@misc{indiciae64ccc3518cb3,
  title = {Fault localization in a microfabricated surface ion trap using diamond nitrogen-vacancy center magnetometry},
  author = {Kehayias, Pauli Mark [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States); Massachusetts Institute of Technology (MIT), Lexington, MA (United States). Lincoln Laboratory] (ORCID:0000000275974358) and Delaney, Matthew Allen [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0009000226465773) and Haltli, Raymond A. [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000338075078) and Clark, Susan Marie [Sandia National Laboratories 1 , Albuquerque, New Mexico 87185,] (ORCID:0000000199413363) and Revelle, Melissa C. [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000288548278) and Mounce, Andrew M. [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000281152764)},
  year = {2024},
  doi = {10.1063/5.0234269},
  url = {https://www.osti.gov/biblio/2564026},
  note = {Source identifier: 2564026}
}