TY  - RPRT
TI  - Frequency Domain Thermoreflectance for Bond Evaluation in Heterogeneously Integrated Microelectronics
AU  - Hodges, Wyatt Lea
AU  - Jarzembski, Amun
AU  - McDonald, Anthony E.
AU  - Treweek, Benjamin
AU  - Jordan, Matthew
AU  - Bahr, Matthew Nathaniel
AU  - Walsh, Timothy
AU  - Yates, Luke
AU  - Pickrell, Gregory William
PY  - 2024
UR  - https://www.osti.gov/biblio/2564045
ID  - 2564045
ER  -