@misc{indiciae1c78ba4903fb,
  title = {Wafer-scale waveguide sidewall roughness scattering loss characterization by image processing},
  author = {Khurana, Mohit (ORCID:0000000207898672) and Delfan, Sahar and Yi, Zhenhuan (ORCID:0000000348271013)},
  year = {2025},
  doi = {10.1364/oe.558186},
  url = {https://www.osti.gov/biblio/2565044},
  note = {Source identifier: 2565044}
}