@misc{indiciae928e22bccd33,
  title = {X-ray Parametric Down Conversion at an XFEL},
  author = {Hartley, Nicholas J. [SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States); Osaka Univ., Suita (Japan)] and Baxter, James [SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States)] and Curtis, Scott [Brigham Young Univ., Provo, UT (United States)] and Daisuke, Okhura [Osaka Univ., Suita (Japan)] and Halavanau, Aliaksei [SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States)] and Carpenter, Abigail [Brigham Young Univ., Provo, UT (United States)] and Hussain, Janita [SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States)] and Osaka, Taito [Japan Synchrotron Radiation Research Institute, Sayo, Hyogo (Japan)] and Ozaki, Norimasa [Osaka Univ., Suita (Japan)] and Sandberg, Richard [Brigham Young Univ., Provo, UT (United States)] and Shwartz, Sharon [Bar-Ilan Univ., Ramat Gan (Israel)] and Taketoshi, Kai [Osaka Univ., Suita (Japan)] and Yamagata, Naoki [Osaka Univ., Suita (Japan)] and Glenzer, Siegfried [SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States)]},
  year = {2025},
  doi = {10.1364/optica.560275},
  url = {https://www.osti.gov/biblio/2568394},
  note = {Source identifier: 2568394}
}