@misc{indiciaec4ca803c44f1,
  title = {Optical image analysis of WSe 2 − thresholding for layer detection},
  author = {Sahriar, Miah Abdullah [Univ. of Minnesota, Minneapolis, MN (United States)] and Rumman, Abdul Hamid [Bangladesh University of Engineering and Technology (BUET) (Bangladesh)] and Ullah, Ahammad [Bangladesh University of Engineering and Technology (BUET) (Bangladesh)] and Barua, Kaushik [Bangladesh University of Engineering and Technology (BUET) (Bangladesh)] and Monju, Shohaib Ibne [Bangladesh University of Engineering and Technology (BUET) (Bangladesh)] and Jawad, Munim Shahriar [Bangladesh University of Engineering and Technology (BUET) (Bangladesh)] and Faisal, Md. Atik [Bangladesh University of Engineering and Technology (BUET) (Bangladesh)] and Ahsan, Ridwan Radit [Bangladesh University of Engineering and Technology (BUET) (Bangladesh)] and Jang, Houk [Brookhaven National Laboratory (BNL), Upton, NY (United States). Center for Functional Nanomaterials (CFN)] (ORCID:0000000272361134) and Ahmed, Saquib [State Univ. of New York (SUNY), Buffalo, NY (United States)]},
  year = {2025},
  doi = {10.1016/j.commatsci.2025.113888},
  url = {https://www.osti.gov/biblio/2569460},
  note = {Source identifier: 2569460}
}