TY  - RPRT
TI  - Spotlight: efficient automated global optimization in rietveld analysis of diffraction data
AU  - Biwer, Christopher M. [Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)]
AU  - Feng, Zhenxing [Univ. of New Hampshire, Durham, NH (United States); Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)]
AU  - Finstad, Daniel [Syracuse Univ., NY (United States)]
AU  - McDonnell, Marshall [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000237132117)
AU  - Knezevic, Marko [Univ. of New Hampshire, Durham, NH (United States)]
AU  - McKerns, Michael [Los Alamos National Laboratory (LANL), Los Alamos, NM (United States); Uncertainty Quantification Foundation, Wilmington, DE (United States)] (ORCID:0000000183423778)
AU  - Savage, Daniel J. [Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)] (ORCID:0000000199732030)
AU  - Vogel, Sven C. [Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)] (ORCID:0000000320490361)
PY  - 2025
DO  - 10.1038/s41598-025-92452-4
UR  - https://www.osti.gov/biblio/2570774
ID  - 2570774
ER  -