TY  - RPRT
TI  - Hierarchical microstructural parameters governing electrical and thermal conductivity in Al-based eutectic systems
AU  - Lunn, Kentaro F. [Univ. of California, Irvine, CA (United States)] (ORCID:000900038154587X)
AU  - Söderhjelm, Carl [Univ. of California, Irvine, CA (United States)]
AU  - Apelian, Diran [Univ. of California, Irvine, CA (United States)] (ORCID:000000019743606X)
AU  - Rakhmonov, Jovid [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)]
AU  - Wang, Hsin [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)]
PY  - 2025
DO  - 10.1016/j.jallcom.2025.182055
UR  - https://www.osti.gov/biblio/2572180
ID  - 2572180
ER  -