TY  - RPRT
TI  - Fresnel diffraction imaging of surface nanostructure using coherent resonant x-ray scattering
AU  - Burgard, L. [Univ. of Wisconsin, Milwaukee, WI (United States)] (ORCID:0009000330020395)
AU  - Neupane, C. [Univ. of Wisconsin, Milwaukee, WI (United States)] (ORCID:0000000192353644)
AU  - Balodhi, A. [Univ. of Wisconsin, Milwaukee, WI (United States)] (ORCID:0000000290496382)
AU  - Bista, S. [Univ. of Wisconsin, Milwaukee, WI (United States)]
AU  - Butun, S. [Northwestern Univ., Evanston, IL (United States)] (ORCID:0000000163499185)
AU  - Jangid, R. [Brookhaven National Laboratory (BNL), Upton, NY (United States). National Synchrotron Light Source II (NSLS-II)]
AU  - Barbour, A. [Brookhaven National Laboratory (BNL), Upton, NY (United States). National Synchrotron Light Source II (NSLS-II)]
AU  - Basit, N. [Northwestern Univ., Evanston, IL (United States)] (ORCID:000000028473708X)
AU  - Agterberg, D. F. [Univ. of Wisconsin, Milwaukee, WI (United States)] (ORCID:0000000301781374)
AU  - Weinert, M. [Univ. of Wisconsin, Milwaukee, WI (United States)] (ORCID:0000000222632960)
AU  - Mazzoli, C. [Brookhaven National Laboratory (BNL), Upton, NY (United States). National Synchrotron Light Source II (NSLS-II)] (ORCID:0000000197741507)
AU  - Kim, M. G. [Univ. of Wisconsin, Milwaukee, WI (United States)] (ORCID:000000017676454X)
PY  - 2025
DO  - 10.1063/5.0273192
UR  - https://www.osti.gov/biblio/2572793
ID  - 2572793
ER  -