@misc{indiciaeb3d5055d1696,
  title = {Scanning Transmission Electron Microscopy–Atom Probe Tomography Correlative Analysis for the Characterization of Solute-defect Interactions},
  author = {Chen, Siwei [Univ. of Tennessee, Knoxville, TN (United States)] (ORCID:0000000299355420) and Poplawsky, Jonathan D. [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000242727043) and Zinkle, Steven J. [Univ. of Tennessee, Knoxville, TN (United States); Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] and Boebinger, Matthew [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000196222043) and Zhao, Yajie [Univ. of Tennessee, Knoxville, TN (United States)]},
  year = {2025},
  doi = {10.1093/mam/ozaf039},
  url = {https://www.osti.gov/biblio/2573131},
  note = {Source identifier: 2573131}
}