@misc{indiciae61bc0ba53d6e,
  title = {Spectral interferometry-based microwave-frequency vibrometry for integrated acoustic wave devices},
  author = {Thomas, Joseph G. [Virginia Polytechnic Inst. and State Univ. (Virginia Tech), Blacksburg, VA (United States)] (ORCID:0000000236825931) and Xi, Zichen [Virginia Polytechnic Inst. and State Univ. (Virginia Tech), Blacksburg, VA (United States)] and Ji, Jun [Virginia Polytechnic Inst. and State Univ. (Virginia Tech), Blacksburg, VA (United States)] and Shi, Guannan [Virginia Polytechnic Inst. and State Univ. (Virginia Tech), Blacksburg, VA (United States)] and Srijanto, Bernadeta R. [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000211881267) and Kravchenko, Ivan I. [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000349995822) and Yao, Yu [Arizona State Univ., Tempe, AZ (United States)] (ORCID:000000034892052X) and Shao, Linbo [Virginia Polytechnic Inst. and State Univ. (Virginia Tech), Blacksburg, VA (United States)] (ORCID:0000000206157848) and Zhu, Yizheng [Virginia Polytechnic Inst. and State Univ. (Virginia Tech), Blacksburg, VA (United States)] (ORCID:0000000180990371)},
  year = {2025},
  doi = {10.1364/optica.560740},
  url = {https://www.osti.gov/biblio/2573158},
  note = {Source identifier: 2573158}
}