@misc{indiciae5c1ccd84e57a,
  title = {Deriving Material Properties from Feedback Error Signals in Scanning Tunneling Microscopy},
  author = {Sharma, Nileema [University of Notre Dame, IN (United States)] and McKenzie, James [University of Notre Dame, IN (United States)] and Toole, Matthew [University of Notre Dame, IN (United States)] and Ortiz, Brenden R. [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States); University of California, Santa Barbara, CA (United States)] (ORCID:0000000213337003) and Salinas, Andrea Capa [University of California, Santa Barbara, CA (United States)] and Wilson, Stephen D. [University of California, Santa Barbara, CA (United States)] and Liu, Xiaolong [University of Notre Dame, IN (United States)] (ORCID:0000000261865257)},
  year = {2025},
  doi = {10.1021/acs.nanolett.4c06404},
  url = {https://www.osti.gov/biblio/2573309},
  note = {Source identifier: 2573309}
}