TY  - RPRT
TI  - Deriving Material Properties from Feedback Error Signals in Scanning Tunneling Microscopy
AU  - Sharma, Nileema [University of Notre Dame, IN (United States)]
AU  - McKenzie, James [University of Notre Dame, IN (United States)]
AU  - Toole, Matthew [University of Notre Dame, IN (United States)]
AU  - Ortiz, Brenden R. [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States); University of California, Santa Barbara, CA (United States)] (ORCID:0000000213337003)
AU  - Salinas, Andrea Capa [University of California, Santa Barbara, CA (United States)]
AU  - Wilson, Stephen D. [University of California, Santa Barbara, CA (United States)]
AU  - Liu, Xiaolong [University of Notre Dame, IN (United States)] (ORCID:0000000261865257)
PY  - 2025
DO  - 10.1021/acs.nanolett.4c06404
UR  - https://www.osti.gov/biblio/2573309
ID  - 2573309
ER  -