@misc{indiciaef60cb162155f,
  title = {Deep Learning with Reflection High-Energy Electron Diffraction Images to Predict Cation Ratio in Sr 2 x Ti 2(1– x ) O 3 Thin Films},
  author = {Harris, Sumner B. [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000349050482) and Gemperline, Patrick T. [Auburn Univ., AL (United States)] and Rouleau, Christopher M. [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000254883537) and Vasudevan, Rama K. [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000346928579) and Comes, Ryan B. [Auburn Univ., AL (United States); Univ. of Delaware, Newark, DE (United States)] (ORCID:0000000253046921)},
  year = {2025},
  doi = {10.1021/acs.nanolett.5c00787},
  url = {https://www.osti.gov/biblio/2573380},
  note = {Source identifier: 2573380}
}