TY  - RPRT
TI  - Deep Learning with Reflection High-Energy Electron Diffraction Images to Predict Cation Ratio in Sr 2 x Ti 2(1– x ) O 3 Thin Films
AU  - Harris, Sumner B. [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000349050482)
AU  - Gemperline, Patrick T. [Auburn Univ., AL (United States)]
AU  - Rouleau, Christopher M. [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000254883537)
AU  - Vasudevan, Rama K. [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000346928579)
AU  - Comes, Ryan B. [Auburn Univ., AL (United States); Univ. of Delaware, Newark, DE (United States)] (ORCID:0000000253046921)
PY  - 2025
DO  - 10.1021/acs.nanolett.5c00787
UR  - https://www.osti.gov/biblio/2573380
ID  - 2573380
ER  -