TY  - RPRT
TI  - Development of Decay Heat Sensitivity Analysis Capability in SCALE/ORIGEN
AU  - Jeon, Byoung-kyu [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000157569669)
AU  - Wieselquist, William A. [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000222117395)
PY  - 2024
DO  - 10.2172/2573633
UR  - https://www.osti.gov/biblio/2573633
ID  - 2573633
ER  -