@misc{indiciaebb4e7e35d02b,
  title = {An Integrated High-Speed Microstructural Characterization Method Using Simultaneous XRD, Stereo-DIC, and PCI},
  author = {Kirk, C. D. [Purdue Univ., West Lafayette, IN (United States)] (ORCID:0000000157558257) and Roginski, A. R. [Purdue Univ., West Lafayette, IN (United States)] and Clark, S. J. [Argonne National Laboratory (ANL), Argonne, IL (United States)] and Fezzaa, K. [Argonne National Laboratory (ANL), Argonne, IL (United States)] and Chen, W. W. [Iowa State Univ., Ames, IA (United States)]},
  year = {2025},
  doi = {10.1007/s40870-025-00476-8},
  url = {https://www.osti.gov/biblio/2574055},
  note = {Source identifier: 2574055}
}