TY  - RPRT
TI  - An Integrated High-Speed Microstructural Characterization Method Using Simultaneous XRD, Stereo-DIC, and PCI
AU  - Kirk, C. D. [Purdue Univ., West Lafayette, IN (United States)] (ORCID:0000000157558257)
AU  - Roginski, A. R. [Purdue Univ., West Lafayette, IN (United States)]
AU  - Clark, S. J. [Argonne National Laboratory (ANL), Argonne, IL (United States)]
AU  - Fezzaa, K. [Argonne National Laboratory (ANL), Argonne, IL (United States)]
AU  - Chen, W. W. [Iowa State Univ., Ames, IA (United States)]
PY  - 2025
DO  - 10.1007/s40870-025-00476-8
UR  - https://www.osti.gov/biblio/2574055
ID  - 2574055
ER  -