@misc{indiciae2a12ecefa04f,
  title = {DROP DURABILITY ASSESSMENT OF ELECTRONIC ASSEMBLIES UNDER OFF-AXIS LOADING WITH SKEWED FIXTURES},
  author = {Hower, Jonathan [Kansas City National Security Campus (KCNSC), Kansas City, MO (United States)]},
  year = {2025},
  url = {https://www.osti.gov/biblio/2575149},
  note = {Source identifier: 2575149}
}