TY  - RPRT
TI  - Surface science insight note: Optimizing XPS instrument performance for quantification of spectra
AU  - Fernandez, Vincent [Centre National de la Recherche Scientifique (CNRS) (France); Université de Nantes (France)]
AU  - Renault, Olivier [Univ. Grenoble Alpes (France)]
AU  - Fairley, Neal [Casa Software Ltd, Teignmouth, (United Kingdom)]
AU  - Baltrusaitis, Jonas [Lehigh Univ., Bethlehem, PA (United States)] (ORCID:000000015634955X)
PY  - 2024
DO  - 10.1002/sia.7296
UR  - https://www.osti.gov/biblio/2575934
ID  - 2575934
ER  -