@misc{indiciaeed8f855d13b5,
  title = {GaN-Based Threshold Switching Behaviors at High Temperatures Enabled by Interface Engineering for Harsh Environment Memory Applications},
  author = {Fu, Kai (ORCID:0000000294057512) and Luo, Shisong (ORCID:0000000151420935) and Fu, Houqiang (ORCID:0000000211258328) and Hatch, Kevin and Alugubelli, Shanthan and Liu, Hanxiao (ORCID:0000000331067542) and Li, Tao (ORCID:0000000309161743) and Xu, Mingfei (ORCID:0000000217171290) and Mei, Zhaobo and He, Ziyi (ORCID:0000000338336426) and Zhou, Jingan (ORCID:0000000270577783) and Chang, Cheng (ORCID:0000000206770677) and Ponce, Fernando (ORCID:0000000212759386) and Nemanich, Robert (ORCID:0000000335768178) and Zhao, Yuji (ORCID:0000000191994159)},
  year = {2024},
  doi = {10.1109/ted.2023.3321562},
  url = {https://www.osti.gov/biblio/2579835},
  note = {Source identifier: 2579835}
}