@misc{indiciae6cee299301a1,
  title = {Measuring error rates of mid-circuit measurements},
  author = {Hothem, Daniel [Sandia National Laboratories (SNL-CA), Livermore, CA (United States)] (ORCID:0000000256289945) and Hines, Jordan [University of California, Berkeley, CA (United States); Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] and Baldwin, Charles [Quantinuum, Broomfield, CO (United States)] (ORCID:0000000339387428) and Gresh, Dan [Quantinuum, Broomfield, CO (United States)] and Blume-Kohout, Robin [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:000000018134948X) and Proctor, Timothy [Sandia National Laboratories (SNL-CA), Livermore, CA (United States)] (ORCID:0000000302198930)},
  year = {2025},
  doi = {10.1038/s41467-025-60923-x},
  url = {https://www.osti.gov/biblio/2583864},
  note = {Source identifier: 2583864}
}