TY  - RPRT
TI  - Optimizing 4d Emittance Measurements Using the Pinhole Scan Technique
AU  - Owusu, Peter P. [Arizona State University, Tempe, AZ, USA]
AU  - Zhang, C. [Cornell Univ., Ithaca, NY (United States)]
AU  - Bartnik, A. [Cornell Univ., Ithaca, NY (United States)]
AU  - Kalpada, T. [Arizona State Univ., Tempe, AZ (United States)]
AU  - Anawalt, J. [Arizona State Univ., Tempe, AZ (United States)]
AU  - Maxson, J. [Cornell Univ., Ithaca, NY (United States)]
AU  - Karkare, S. [Arizona State Univ., Tempe, AZ (United States)]
PY  - 2025
DO  - 10.2172/2584103
UR  - https://www.osti.gov/biblio/2584103
ID  - 2584103
ER  -