@misc{indiciaee8c230b74f81,
  title = {Safe and Robust Binary Classification and Fault Detection Using Reinforcement Learning},
  author = {Netter, Josh [Georgia Institute of Technology, Atlanta, GA (United States)] (ORCID:0009000105669024) and Vamvoudakis, Kyriakos G. [Georgia Institute of Technology, Atlanta, GA (United States)] (ORCID:0000000319784848) and Walsh, Timothy F. [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000295274025) and Ray, Jaideep [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0009000099087035)},
  year = {2025},
  doi = {10.1109/ojcsys.2025.3572375},
  url = {https://www.osti.gov/biblio/2585636},
  note = {Source identifier: 2585636}
}