TY  - RPRT
TI  - Charge Trap Layer Supercharging for Improved Bit Reliability in 3-D NAND Flash Under Proton Irradiation
AU  - Breeding, Matthew Luel [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000196375840)
AU  - Teijeiro, Antonio Emilio [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)]
AU  - Hughart, David Russell [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000325862494)
AU  - Young, Joshua Michael [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000284990368)
AU  - Black, Dolores Archuleta [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000252823506)
AU  - Black, Jeffrey D. [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000330587992)
AU  - Wilcox, Edward P. [NASA Goddard Space Flight Center (GSFC), Greenbelt, MD (United States)] (ORCID:0000000179971309)
PY  - 2025
DO  - 10.1109/tns.2025.3549487
UR  - https://www.osti.gov/biblio/2585645
ID  - 2585645
ER  -